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Name
Alves, E.
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Subject
Fulltext
Results 1-8 of 8 (Search time: 0.01 seconds).
Issue Date | Title | Author(s) | Type | Access | |
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1 | 2000 | Characterisation of Ti1-xSixNy nanocomposite films | Vaz, F. ; Rebouta, L. ; Goudeau, P. ; Pacaud, J. ; Garem, H. ; Rivière, J. P. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
2 | 2003 | Effects of the morphology and structure on the elastic behavior of (Ti,Si,Al)N nanocomposites | Carvalho, S. ; Ribeiro, E. ; Rebouta, L. ; Vaz, F. ; Alves, E. ; Schneider, D. ; Cavaleiro, A. | article | openAccess |
3 | 2001 | Elastic properties of (Ti,Al,Si)N nanocomposite films | Carvalho, S. ; Vaz, F. ; Rebouta, L. ; Schneider, D. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
4 | 2008 | Influence of air oxidation on the properties of decorative NbOxNy coatings prepared by reactive gas pulsing | Chappé, J. M. ; Carvalho, P. ; Lanceros-Mendez, S. ; Vasilevskiy, M. I. ; Vaz, F. ; Machado, A. V. ; Fenker, M. ; Kappl, H. ; Parreira, N. M. G. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
5 | 2007 | Influence of the O/C ratio in the behaviour of TiCxOy thin films | Fernandes, A. C. ; Vaz, F. ; Rebouta, L. ; Pinto, A. ; Alves, E. ; Parreira, N. M. G. ; Goudeau, Ph. ; Bourhis, E. Le ; Rivière, J. P. | article | openAccess |
6 | 2004 | Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage | Vaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
7 | 2006 | Structural evolution in ZrNxOy thin films as a function of temperature | Cunha, L. ; Vaz, F. ; Moura, C. ; Rebouta, L. ; Carvalho, P. ; Alves, E. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
8 | 2005 | Structural stability of decorative ZrNxOy thin films | Carvalho, P. ; Vaz, F. ; Rebouta, L. ; Carvalho, S. ; Cunha, L. ; Goudeau, Ph. ; Rivière, J. P. ; Alves, E. ; Cavaleiro, A. | article | openAccess |