Utilize este identificador para referenciar este registo:
https://hdl.handle.net/10316/4481
Título: | Study by X-ray diffraction and mechanical analysis of the residual stress generation during thermal spraying | Autor: | Pina, J. Dias, A. Lebrun, J. L. |
Palavras-chave: | Thermal spray coatings; Atmospheric plasma spraying; High velocity oxygen fuel; Residual stresses; X-ray stress evaluation | Data: | 2003 | Citação: | Materials Science and Engineering A. 347:1-2 (2003) 21-31 | Resumo: | Thermally sprayed coatings are formed by the deposition of molten or partially molten particles, propelled onto a substrate where they impact, spread and solidify rapidly. Residual stresses are expected within the sprayed deposit as a consequence of the release of thermal and kinetic energies. A wide range of materials and two spraying techniques are considered in this study, namely atmospheric plasma spraying (APS) and high-velocity oxygen fuel. Stresses were determined by the X-ray diffraction (XRD) method. The results were compared with those calculated by mechanical analysis of stress relief in coatings detached from the substrate. Comparison of the results for adherent and free-standing coatings shows that the residual stress state can be resolved in terms of the components suggested by models that propose two stages of stress generation: quenching stresses and secondary-cooling stresses. The in-depth distribution of residual stresses, through the coating thickness, is discussed in terms of the nature of the coating system. | URI: | https://hdl.handle.net/10316/4481 | DOI: | 10.1016/S0921-5093(02)00580-4 | Direitos: | openAccess |
Aparece nas coleções: | FCTUC Física - Artigos em Revistas Internacionais |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
---|---|---|---|---|
file4ccd1dde07844a4b82f367670be7af26.pdf | 1.03 MB | Adobe PDF | Ver/Abrir |
Citações SCOPUSTM
104
Visto em 22/abr/2024
Citações WEB OF SCIENCETM
95
Visto em 2/abr/2024
Visualizações de página 50
501
Visto em 23/abr/2024
Downloads 50
740
Visto em 23/abr/2024
Google ScholarTM
Verificar
Altmetric
Altmetric
Todos os registos no repositório estão protegidos por leis de copyright, com todos os direitos reservados.