Please use this identifier to cite or link to this item: https://hdl.handle.net/10316/109759
DC FieldValueLanguage
dc.contributor.authorHanson, George W-
dc.contributor.authorSilveirinha, Mário G.-
dc.contributor.authorBurghignoli, Paolo-
dc.contributor.authorYakovlev, Alexander B-
dc.date.accessioned2023-10-25T10:56:53Z-
dc.date.available2023-10-25T10:56:53Z-
dc.date.issued2013-
dc.identifier.issn1367-2630pt
dc.identifier.urihttps://hdl.handle.net/10316/109759-
dc.description.abstractWe show that the non-local susceptibility ¯ (r, r0) for a nontranslationally invariant homogenized wire medium is, modulo a constant, given by a simple Green function related to the material geometry. We also show that two previous methods for solving wave interaction problems for bounded wire media (wave expansion method and transport equation) are equivalent to each other, and to a third method involving particle reflection at the boundary. We discuss the importance of the dead layer or virtual interface, and find it to be analogous to the excitonic semiconductor case. Several examples are provided to clarify the material.pt
dc.language.isoengpt
dc.publisherInstitute of Physics Publishingpt
dc.rightsopenAccesspt
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/pt
dc.titleNon-local susceptibility of the wire medium in the spatial domain considering material boundariespt
dc.typearticle-
degois.publication.firstPage083018pt
degois.publication.issue8pt
degois.publication.titleNew Journal of Physicspt
dc.peerreviewedyespt
dc.identifier.doi10.1088/1367-2630/15/8/083018pt
degois.publication.volume15pt
dc.date.embargo2013-01-01*
uc.date.periodoEmbargo0pt
item.grantfulltextopen-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.openairetypearticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextCom Texto completo-
crisitem.author.researchunitIT - Institute of Telecommunications-
crisitem.author.orcid0000-0002-3730-1689-
Appears in Collections:I&D IT - Artigos em Revistas Internacionais
FCTUC Eng.Electrotécnica - Artigos em Revistas Internacionais
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