Please use this identifier to cite or link to this item: https://hdl.handle.net/10316/106940
Title: Fatigue crack growth in notched specimens: a numerical analysis
Authors: Antunes, F. V. 
Branco, R. 
Prates, P. 
Costa, J. D.M. 
Keywords: Fatigue crack growth; Notches; Plastic CTO; Crack closure
Issue Date: 2019
Publisher: Gruppo Italiano Frattura
Project: FEDER funds through the program COMPETE (under project T449508144- 00019113) 
PTDC/EMS-PRO/1356/2014 
SFRH/BPD/101465/2014 
Serial title, monograph or event: Frattura ed Integrita Strutturale
Volume: 13
Issue: 48
Abstract: Fatigue crack growth (FCG) is linked to irreversible and nonlinear processes happening at the crack tip, which explains different problems observed in the use of da/dN-ΔK curves. The replacement of ΔK by nonlinear crack tip parameters, namely the crack tip opening displacement (CTOD) is an interesting alternative. The objective in here is to study the effect of notches on FCG using the plastic CTOD range, δp. M(T) specimens with lateral notches of different radius (1, 2, 4 and 8 mm were analysed numerically, keeping the total depth constant (8 mm). The increase of crack length increases δp and therefore FCG rate. For plane stress state, the formation of the residual plastic wake with crack propagation, produces crack closure which compensates the effect of crack length and there is a stabilization of δp. The reduction of notch radius increases δp for all crack lengths, particularly for the shortest ones. For plane strain state there is almost no crack closure therefore δp is higher than for plane stress state, and the effect of crack length produces a relatively fast increase of δp.
URI: https://hdl.handle.net/10316/106940
ISSN: 19718993
DOI: 10.3221/IGF-ESIS.48.63
Rights: openAccess
Appears in Collections:I&D CEMMPRE - Artigos em Revistas Internacionais

Show full item record

SCOPUSTM   
Citations

2
checked on Apr 22, 2024

WEB OF SCIENCETM
Citations

2
checked on Apr 2, 2024

Page view(s)

36
checked on Apr 23, 2024

Download(s)

7
checked on Apr 23, 2024

Google ScholarTM

Check

Altmetric

Altmetric


This item is licensed under a Creative Commons License Creative Commons