Please use this identifier to cite or link to this item: https://hdl.handle.net/10316/103717
Title: Analysis and Simulation of Epidemic COVID-19 Curves with the Verhulst Model Applied to Statistical Inhomogeneous Age Groups
Authors: Vandamme, Lode K. J.
Rocha, Paulo R. F. 
Keywords: COVID-19; pandemics; contamination peaks; limited growth models; Verhulst model; logistic equations
Issue Date: 2021
Publisher: MDPI
Project: European Union’s Horizon 2020 research and innovation programme (grant agreement No. 947897) 
Serial title, monograph or event: Applied Sciences (Switzerland)
Volume: 11
Issue: 9
Abstract: Pandemic curves, such as COVID-19, often show multiple and unpredictable contamination peaks, often called second, third and fourth waves, which are separated by wide plateaus. Here, by considering the statistical inhomogeneity of age groups, we show a quantitative understanding of the different behaviour rules to flatten a pandemic COVID-19 curve and concomitant multi-peak recurrence. The simulations are based on the Verhulst model with analytical generalized logistic equations for the limited growth. From the log–lin plot, we observe an early exponential growth proportional to et/tgrow . The first peak is often grow = 5 d. The exponential growth is followed by a recovery phase with an exponential decay proportional to e􀀀t/trecov . For the characteristic time holds: tgrow < trecov. Even with isolation, outbreaks due to returning travellers can result in a recurrence of multi-peaks visible on log–lin scales. The exponential growth for the first wave is faster than for the succeeding waves, with characteristic times, of about 10 d. Our analysis ascertains that isolation is an efficient method in preventing contamination and enables an improved strategy for scientists, governments and the general public to timely balance between medical burdens, mental health, socio-economic and educational interests.
URI: https://hdl.handle.net/10316/103717
ISSN: 2076-3417
DOI: 10.3390/app11094159
Rights: openAccess
Appears in Collections:I&D CFE - Artigos em Revistas Internacionais

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