Please use this identifier to cite or link to this item:
https://hdl.handle.net/10316/4235
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Galvan, D. | - |
dc.contributor.author | Pei, Y. T. | - |
dc.contributor.author | Hosson, J. Th. M. De | - |
dc.contributor.author | Cavaleiro, A. | - |
dc.date.accessioned | 2008-09-01T10:44:25Z | - |
dc.date.available | 2008-09-01T10:44:25Z | - |
dc.date.issued | 2005 | en_US |
dc.identifier.citation | Surface and Coatings Technology. 200:1-4 (2005) 739-743 | en_US |
dc.identifier.uri | https://hdl.handle.net/10316/4235 | - |
dc.description.abstract | Electron energy loss spectroscopy (EELS) in a transmission electron microscope (TEM) was employed to estimate the sp3 C content in magnetron sputtered H-free a-C coatings. The deconvolution procedure developed reduces considerably the error which is due to beam point spread function and sample thickness. The methodology has been applied to thin a-C films deposited through RF magnetron sputtering, and determined that, under the present values of ion current to the substrates (<Â 1 mA/cm2), a variation in energy of the upcoming ions (achieved through a variation in applied substrate bias) has a negligible influence on the C atoms hybridization. | en_US |
dc.description.uri | http://www.sciencedirect.com/science/article/B6TVV-4FRJM05-B/1/80f13f58505277c1e189b28d9bafa1c3 | en_US |
dc.format.mimetype | aplication/PDF | en |
dc.language.iso | eng | eng |
dc.rights | openAccess | eng |
dc.subject | sp3/sp2 | en_US |
dc.title | Determination of the sp3 C content of a-C films through EELS analysis in the TEM | en_US |
dc.type | article | en_US |
dc.identifier.doi | 10.1016/j.surfcoat.2005.02.071 | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.grantfulltext | open | - |
item.languageiso639-1 | en | - |
item.fulltext | Com Texto completo | - |
item.openairetype | article | - |
crisitem.author.researchunit | CEMMPRE - Centre for Mechanical Engineering, Materials and Processes | - |
crisitem.author.orcid | 0000-0001-8251-5099 | - |
Appears in Collections: | FCTUC Eng.Mecânica - Artigos em Revistas Internacionais |
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file4665345249a34fee91946fdd72b286bb.pdf | 180 kB | Adobe PDF | View/Open |
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