Please use this identifier to cite or link to this item: https://hdl.handle.net/10316/106494
DC FieldValueLanguage
dc.contributor.authorIvanov, Maxim S-
dc.contributor.authorKhomchenko, Vladimir A.-
dc.contributor.authorSilibin, Maxim V.-
dc.contributor.authorKarpinsky, Dmitry V.-
dc.contributor.authorBlawert, Carsten-
dc.contributor.authorSerdechnova, Maria-
dc.contributor.authorPaixão, José A.-
dc.date.accessioned2023-04-05T09:52:20Z-
dc.date.available2023-04-05T09:52:20Z-
dc.date.issued2020-05-14-
dc.identifier.issn2079-4991-
dc.identifier.urihttps://hdl.handle.net/10316/106494-
dc.description.abstractIn this work we demonstrate the role of grain boundaries and domain walls in the local transport properties of n- and p-doped bismuth ferrites, including the influence of these singularities on the space charge imbalance of the energy band structure. This is mainly due to the charge accumulation at domain walls, which is recognized as the main mechanism responsible for the electrical conductivity in polar thin films and single crystals, while there is an obvious gap in the understanding of the precise mechanism of conductivity in ferroelectric ceramics. The conductivity of the Bi0.95Ca0.05Fe1-xTixO3-δ (x = 0, 0.05, 0.1; δ = (0.05 - x)/2) samples was studied using a scanning probe microscopy approach at the nanoscale level as a function of bias voltage and chemical composition. The obtained results reveal a distinct correlation between electrical properties and the type of charged defects when the anion-deficient (x = 0) compound exhibits a three order of magnitude increase in conductivity as compared with the charge-balanced (x = 0.05) and cation-deficient (x = 0.1) samples, which is well described within the band diagram representation. The data provide an approach to control the transport properties of multiferroic bismuth ferrites through aliovalent chemical substitution.pt
dc.description.sponsorshipThe reported study was funded by RFBR according to the research project No. 18-38-20020 mol_a_ved. Experimental investigations done at the CFisUC were supported by Fundação para a Ciência e a Tecnologia (FCT), through the projects CENTRO-01-0145-FEDER-000014, IF/00819/2014/CP1223/CT0011, and UID/04564/2020 (co-funded by FEDER/COMPETE). Access to TAIL-UC facility funded under QREN-Mais Centro project ICT_2009_02_012_1890 is gratefully acknowledged. M.V.S. acknowledges Russian academic excellence project “5-100” for Sechenov University. D.V.K., M.V.S., C.B, M.S. acknowledge the support of the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No. 778070.-
dc.language.isoengpt
dc.publisherMDPIpt
dc.rightsopenAccesspt
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/pt
dc.subjectBiFeO3pt
dc.subjectscanning probe microscopypt
dc.subjectgrain boundariespt
dc.subjectdomain wallspt
dc.subjectN- and p-type conductivitypt
dc.titleInvestigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approachpt
dc.typearticlept
degois.publication.firstPage940pt
degois.publication.issue5pt
degois.publication.titleNanomaterialspt
dc.peerreviewedyespt
dc.identifier.doi10.3390/nano10050940-
degois.publication.volume10pt
dc.date.embargo2020-05-14*
dc.identifier.pmid32422891-
uc.date.periodoEmbargo0pt
item.grantfulltextopen-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.openairetypearticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextCom Texto completo-
crisitem.author.researchunitCFisUC – Center for Physics of the University of Coimbra-
crisitem.author.researchunitCFisUC – Center for Physics of the University of Coimbra-
crisitem.author.orcid0000-0002-5867-3297-
crisitem.author.orcid0000-0003-4634-7395-
Appears in Collections:I&D CFis - Artigos em Revistas Internacionais
Show simple item record

Page view(s)

40
checked on May 8, 2024

Download(s)

12
checked on May 8, 2024

Google ScholarTM

Check

Altmetric

Altmetric


This item is licensed under a Creative Commons License Creative Commons