Please use this identifier to cite or link to this item: http://hdl.handle.net/10316/4359
DC FieldValueLanguage
dc.contributor.authorSilva, C.P.-
dc.contributor.authorPinto da Cunha, J.-
dc.contributor.authorChepel, V.-
dc.contributor.authorPereira, A.-
dc.contributor.authorSolovov, V.-
dc.contributor.authorMendes, P.-
dc.contributor.authorNeves, F.-
dc.contributor.authorLopes, M.I.-
dc.date.accessioned2008-09-01T11:05:46Z-
dc.date.available2008-09-01T11:05:46Z-
dc.date.issued2007en_US
dc.identifier.citationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 580:1 (2007) 322-325en_US
dc.identifier.urihttp://hdl.handle.net/10316/4359-
dc.description.abstractA chamber designed for measuring the angular distribution of reflected ultraviolet vacuum light is described. We report first measurements of the reflection profile of xenon scintillation light by a polished copper surface and by polytetrafluoroethylene (PTFE).en_US
dc.description.urihttp://www.sciencedirect.com/science/article/B6TJM-4NTB92C-1/1/01c2ff1d3b516ce3fda2bd84949e2925en_US
dc.format.mimetypeaplication/PDFen
dc.language.isoengeng
dc.rightsopenAccesseng
dc.subjectReflectanceen_US
dc.subjectXenon scintillationen_US
dc.subjectLiquid xenonen_US
dc.titleMeasuring the angular profile of the reflection of xenon scintillation lighten_US
dc.typearticleen_US
dc.identifier.doi10.1016/j.nima.2007.05.166-
item.fulltextCom Texto completo-
item.grantfulltextopen-
item.languageiso639-1en-
crisitem.author.orcid0000-0003-0675-4586-
crisitem.author.orcid0000-0002-0659-7034-
Appears in Collections:FCTUC Física - Artigos em Revistas Internacionais
Files in This Item:
File Description SizeFormat
filee6839fe99860428884bf9765ebb8cc5f.pdf173.27 kBAdobe PDFView/Open
Show simple item record

WEB OF SCIENCETM
Citations

8
checked on Aug 2, 2022

Page view(s)

225
checked on Sep 27, 2022

Download(s)

215
checked on Sep 27, 2022

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.