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Name
Marques, M. F. Ferreira
 
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Publications
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Subject:  Doppler broadening

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Issue DateTitleAuthor(s)TypeAccess
11-Sep-2008On the defect pattern evolution in sapphire irradiated by swift ions in a broad fluence rangeGordo, P. M. ; Liszkay, L. ; Kajcsos, Zs. ; Havancsák, K. ; Skuratov, V. A. ; Kögel, G. ; Sperr, P. ; Egger, W. ; Lima, A. P. de ; Marques, M. F. Ferreira articleopenAccess
22007Positron annihilation and constant photocurrent method measurements on a-Si:H films: A comparative approach to defect identificationGordo, P. M. ; Marques, M. F. Ferreira ; Gil, C. Lopes ; Lima, A. P. de ; Lavareda, G. ; Carvalho, C. Nunes de ; Amaral, A. ; Kajcsos, Zs. articleopenAccess
32007Positron studies of the temperature-dependence of free volumes in Polydimethylsiloxane/poly(propylene oxide) urethane/urea membranesMarques, M. F. Ferreira ; Gordo, P. M. ; Kajcsos, Zs. ; Gil, C. Lopes ; Lima, A. P. de ; Queiroz, D. P. ; Pinho, M. N. de articleopenAccess